Digital System Test And Testable Design: Using ... Guide

The material is structured into two main parts: developing test environments and implementing testable hardware. Key Topics Covered

Are you interested in a specific from the book, like BIST or Boundary Scan , for a more detailed breakdown? Courses Syllabus – Monsoon 2024 - pgadmissions@iiit.ac.in Digital System Test and Testable Design: Using ...

Gate-level faults, fault collapsing, and structural modeling in Verilog. The material is structured into two main parts:

The text treats testing and testability as integral parts of the digital design process rather than afterthoughts. like BIST or Boundary Scan

Random and deterministic test generation methods, plus sequential circuit test generation.

It utilizes Verilog models and testbenches to implement fault simulation and test generation algorithms.